WIT Press


Invited Paper Theoretical Foundation For High-resolution Modeling Of Thin Fluid Films With BEM

Price

Free (open access)

Paper DOI

10.2495/BE930041

Volume

1

Pages

26

Published

1993

Size

1,821 kb

Author(s)

C.H.T. Pan & J.J. Rencis

Abstract

Invited Paper Theoretical foundation for high-resolution modeling of thin fluid films with BEM C.H.T. Pan*, J.J. Rencis^ "Columbia University, Digital Equipment Corporation, Millbury, Massachusetts 01527, USA Mechanical Engineering Department, Worcester Polytechnic Institute, Worcester, Massachusetts 01609, USA ABSTRACT In modeling thin fluid films with the high resolution algorithm (HRA), Pan et al. [1], Li and Pan [2], two computational scales are present on any line in the interior of the domain of interest. The coarse scale is governed by discretization of the two-dimensional physical space and determines the economical aspects of computation. The fine scale deals with distributed fields imbedded within the discretized computation system. An accurate pressure profile is obtained by performing integration along the interior mesh line with a "precisely" described film thickness profile and the mean longitudinal flux in the role of a local

Keywords