Author(s)

D.T. Pham & E. Oztemel

Abstract

Combining multi-layer perceptrons with heuristics for reliable control chart pattern classification D.T. Pham & E. Oztemel Intelligent Systems Research Laboratory, School of Electrical, Electronic and Systems Engineering, University of Wales College of Cardiff, P. 0. Box ABSTRACT A hybrid system for on-line control chart pattern classification is presented. The system comprises three different pattern classification modules, a rule-based module and two multi-layer perceptron modules. Each module is set up, initialised and trained independently. The outputs of the hybrid system are produced by a decision making module which synergistically combines the outputs of the individual modules. INTRODUCTION Statistical process control charts can exhibit patterns which reflect the long term behaviour of the process being monitored. These patterns can indicate that the process is operating normally ("normal" patterns) or that an abnormal situation is taking place, for exampl

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