WIT Press


Identification Method For Scale, Pitch And Yaw Deviations With Linear Measurements

Price

Free (open access)

Paper DOI

10.2495/LAMDAMAP030431

Volume

44

Pages

12

Published

2003

Size

265 kb

Author(s)

Y. Dupont, G.M. Cloutier & J.R.R. Mayer

Abstract

This paper suggests a new method of identification for both translational and rotational deviations of a prismatic mobility with solely linear optics. A mathematic model is developed for laser interferometer measurements and a matrix identification system is built for calculating scale, pitch and yaw deviations of an X axis. The system is solved using the pseudo-inverse method. A sensitivity study of this solution, with regards to the system uncertainties, is achieved using a jacobian matrix. The benefits of ths new method compared to angular optic measurements are given using analytical equations. Finally, experimental results are presented. 1 Introduction The positioning accuracy of modern machine tools remains a prime concern in performance improvement. Machining precision is part

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