WIT Press


Development Of The Next Generation Of 3D Probing Systems For The Future Co-ordinate Measuring Machines And Machine Tools

Price

Free (open access)

Paper DOI

10.2495/LAMDAMAP970151

Volume

16

Pages

17

Published

1997

Size

1,455 kb

Author(s)

D.R. McMurtry

Abstract

This paper is a brief written version of a keynote address prepared for Lamdamap 97. The talk examines the lessons learned from the past and present three dimensional (3D) probing systems used on dimensional measuring systems and concludes with the technical developments which are most likely to be required to make substantial advancement in sensor and machine structure technologies for the next generation of Co-ordinate Measuring Machines (CMM) and Machine Tools (MT). Introduction The first 3D touch trigger probe which provides a trigger signal when the stylus contacts the workpiece was introduced in January 1973. This development allowed for the first time accurate and fully automatic measurements to be made by a CMM. Following this, three axis analogue measurement probe

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