Author(s)

Y. Uetsuji, H. Kuramae, K. Tsuchiya & M. Kamlah

Abstract

This paper presents the full components of macroscopic homogenized material properties and the microscopic localized response obtained through a multiscale finite element simulation using realistic crystal morphology. Crystal morphology analysis was performed to reveal microstructure and texture of a polycrystalline piezoelectric material. The insulative specimen of piezoelectric material was coated with a conductive layer of amorphous osmium to remove an electric charge, and crystal orientations were measured by means of electron backscatter diffraction. Then the obtained crystal orientations were applied to a multiscale finite element simulation based on homogenization theory. Keywords: piezoelectric material, EBSD, crystal morphology, multiscale finite element simulation, homogenization theory. 1 Introduction Piezoelectric materials have been used in actuators or sensors as a component of various electronic and mechanical devices. Generally these materials consist of many crystal grains and domains at a microscopic scale. Since each domain shows strongly anisotropic mechanical and electrical behaviours according to

Keywords

piezoelectric material, EBSD, crystal morphology, multiscale finite element simulation, homogenization theory