WIT Press


Fast Acquisition High-resolution Synchrotron Radiation X-ray Microtomography For Academic And Industrial Purposes

Price

Free (open access)

Paper DOI

10.2495/MC050191

Volume

51

Pages

10

Published

2005

Size

2,429 kb

Author(s)

E. Boller, P. Cloetens, R. Mokso, P. Tafforeau, X. Thibault, F. Peyrin, A. Marmottant, P. Pernot & J. Baruchel

Abstract

The use of modern synchrotron radiation sources for monochromatic beam microtomography provides several new possibilities. These include, in addition to reduced signal-to-noise ratio, enhanced spatial resolution and phase contrast imaging, the quantitative measurements and the easy set-up of a sample environment for in-situ and/or real time experiments. Selected applications showing the improved capabilities, with special emphasis on industrially relevant topics, are presented. Keywords: microtomography, synchrotron radiation, phase imaging, fast acquisition, in-situ experiments, industrial applications. 1 Introduction X-ray computed microtomography (µCT), with a spatial resolution in the 20 µm range, has emerged over the recent years. Several laboratory instruments have been developed [1,2] that are now commercially available and produce good results. However, the best quality images, in terms of signal-to-noise ratio and spatial resolution, are obtained on instruments located in synchrotron radiation facilities [3,4], which use a parallel and monochromatic beam, allowing a quantitative use of the data and in-situ and/or real time experiments. This paper reports and illustrates the latest possibilities associated with the availability of third generation sources of synchrotron radiation, such as the European Synchrotron Radiation Facility (ESRF). Section 2 is a brief

Keywords

microtomography, synchrotron radiation, phase imaging, fast acquisition, in-situ experiments, industrial applications.